Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-23T09:45:51.233Z Has data issue: false hasContentIssue false
  • English
  • Français

Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation

Published online by Cambridge University Press:  04 August 2017

P. Nowakowski ,
C.S. Bonifacio ,
M.J. Campin ,
M.L. Ray  and
P.E. Fischione
P. Nowakowski
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA 15632USA
C.S. Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA 15632USA
M.J. Campin
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA 15632USA
M.L. Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA 15632USA
P.E. Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA 15632USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 300 - 301
Copyright
© Microscopy Society of America 2017 

References

[1] Mayer, J, et al, MRS Bull 32 2007). p. 400.CrossRefGoogle Scholar
[2] Pouchou, JL, Pichoir, F & Boivin, D in Microbeam Analysis (eds. JR Michaels & P IngramSan Francisco Press San Franciscop. 120.Google Scholar
[3] Ancey, M, Bastenaire, F & Tixier, R J. Phys. D: Appl. Phys 10 1977). p. 817.CrossRefGoogle Scholar
[4] Nowakowski, P, et al, Surf. Sci 605 2011). p. 848.CrossRefGoogle Scholar