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TEM Investigation of Butterfly and White Etching Area Formed During Rolling Contact Fatigue

Published online by Cambridge University Press:  23 November 2012

V. Bedekar ,
R. Hyde  and
R. Shivpuri
V. Bedekar
Affiliation:
Timken Company, N. Canton, OH
R. Hyde
Affiliation:
Timken Company, N. Canton, OH
R. Shivpuri
Affiliation:
The Ohio State University, Columbus, OH
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1778 - 1779
Copyright
Copyright © Microscopy Society of America 2012

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