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Structural Insights of Supported Nanoparticles By Z-Contrast and High Resolution Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

Judith C. Yang ,
Erin Devlin ,
William Rhodes  and
Steven Bradley
Judith C. Yang
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA, 15260.
Erin Devlin
Affiliation:
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA, 15260.
William Rhodes
Affiliation:
Department of Chemical Engineering, University of Pittsburgh, Pittsburgh, PA, 15260.
Steven Bradley
Affiliation:
UOP, 50 East Algonquin Road, Des Plaines, IL, 60017
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Abstract

A vital component to nanoparticle science will be the three dimensional (3-D) characterization of both structure and chemistry of these nanoparticles on their supports at the nanometer scale and below. to achieve this goal, quantitative Z-contrast and atomic resolution will provide essential information about their structure. Z-contrast imaging is ideal for imaging these large Z nanoparticles on low Z supports. in this proceedings, we present a quantitative Z-contrast method to determine number of atoms and a few examples of a combination of electron microscopy methods to gain structural insights into supported nanoparticle, such as Pt on different support materials, PtRu5 on C and Pt-Sn on SiO2.

A relatively new and powerful method is to determine the number of atoms in a nanoparticle, by very high angle annular dark-field (HAADF) imaging or Z-contrast technique [1, 2]. We have shown that quantification of the absolute image intensity from very HAADF microscopy will provide the number of atoms in very small particles of high atomic number to ±2 atoms for Re6 nanoparticles supported on carbon [3].

Type
Characterization of Catalysts (Organized by S. Bradley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1102 - 1103
Copyright
Copyright © Microscopy Society of America 2001

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References

references

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