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Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?

Published online by Cambridge University Press:  05 August 2007

S Meltem ,
N Philipp M. ,
M Stephan ,
C Boril ,
F Evelin ,
P Peter ,
T Elena ,
G Werner ,
P Harald  and
L Emil J.W.
S Meltem
Affiliation:
Graz University of Technology,Austria
N Philipp M.
Affiliation:
Swiss Federal Laboratories for Materials Testing and Research
M Stephan
Affiliation:
Swiss Federal Laboratories for Materials Testing and Research
C Boril
Affiliation:
Graz University of Technology,Austria
F Evelin
Affiliation:
Graz University of Technology,Austria
P Peter
Affiliation:
Graz University of Technology,Austria
T Elena
Affiliation:
Graz University of Technology,Austria
G Werner
Affiliation:
Graz University of Technology,Austria
P Harald
Affiliation:
Graz University of Technology,Austria
L Emil J.W.
Affiliation:
Graz University of Technology,Austria
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1502 - 1503
Copyright
© 2007 Microscopy Society of America

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