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In Situ Electrical and Mechanical Characterization of individual Nickel Nanowires utilizing Dural Beam Focused Ion Beam and Nanomanipulator Systems

Published online by Cambridge University Press:  23 November 2012

S. Xu ,
M. Jin  and
N. Yao
S. Xu
Affiliation:
Princeton University, Princeton, NJ
M. Jin
Affiliation:
Princeton University, Princeton, NJ
N. Yao
Affiliation:
Princeton University, Princeton, NJ
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 790 - 791
Copyright
Copyright © Microscopy Society of America 2012

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