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First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Published online by Cambridge University Press:  03 August 2008

B Freitag ,
G Knippels ,
S Kujawa ,
M van der Stam ,
D Hubert ,
PC Tiemeijer ,
C Kisielowski ,
P Denes ,
A Minor  and
U Dahmen
B Freitag
Affiliation:
FEI Company, The Netherlands
G Knippels
Affiliation:
FEI Company, The Netherlands
S Kujawa
Affiliation:
FEI Company, The Netherlands
M van der Stam
Affiliation:
FEI Company, The Netherlands
D Hubert
Affiliation:
FEI Company, The Netherlands
PC Tiemeijer
Affiliation:
FEI Company, The Netherlands
C Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory
P Denes
Affiliation:
Lawrence Berkeley National Laboratory
A Minor
Affiliation:
Lawrence Berkeley National Laboratory
U Dahmen
Affiliation:
Lawrence Berkeley National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1370 - 1371
Copyright
© 2008 Microscopy Society of America

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