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Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy

Published online by Cambridge University Press:  06 August 2013

Delu Liu
Delu Liu*
Affiliation:
Department of Materials Physics, University of Science and Technology Beijing, No.30, Xueyuan Road, Beijing 100083, China
*
*Corresponding author. E-mail: deluliu@sina.com
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Abstract

International standard ISO-25498 specifies the method of selected area electron diffraction (SAED) analysis in TEM. It is applicable to the acquisition of SAED patterns, indexing the patterns and calibration of diffraction constant. Several features of this standard are introduced. As an example of the applications, phosphide with nanometer scale in a low-carbon steel produced by compact strip production process was analyzed by SAED and EDX. The phosphide precipitates in the steel are identified as MxP, where x is 2–3 and M is Fe, Ti, Cr, or Ni. It possesses a hexagonal lattice with lattice parameter a = 0.609 nm and c = 0.351 nm.

Keywords

international standardelectron diffractionTEMphosphide precipitateCSP steelsEDS microanalysisnanoparticles
Type
Research Article
Information
Microscopy and Microanalysis , Volume 19 , Supplement S5: IUMAS , August 2013 , pp. 207 - 209
Copyright
Copyright © Microscopy Society of America 2013 

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References

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