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Cs-corrected STEM studies of Ge nanodots grown on slightly oxidized Si(001) surfaces

Published online by Cambridge University Press:  03 August 2008

N Tanaka ,
S-P Cho ,
AA Shklyaev ,
J Yamasaki ,
E Okunishi  and
M Ichikawa
N Tanaka
Affiliation:
Japan Science and Technology Agency
S-P Cho
Affiliation:
Japan Science and Technology Agency
AA Shklyaev
Affiliation:
Japan Science and Technology Agency
J Yamasaki
Affiliation:
Nagoya University, Japan
E Okunishi
Affiliation:
JEOL Ltd
M Ichikawa
Affiliation:
Japan Science and Technology Agency
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 170 - 171
Copyright
© 2008 Microscopy Society of America

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