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Confidence Bounds for the Estimation of the Volume Phase Fraction from a Single Image in a Nickel Base Superalloy

Published online by Cambridge University Press:  30 March 2010

Rémi Blanc ,
Pierre Baylou ,
Christian Germain  and
Jean-Pierre Da Costa
Rémi Blanc
Affiliation:
Rémi Blanc, Computer Vision Laboratory, ETHZ, Sternwartstrasse 7, ETH-Zentrum, CH-8092 Zürich, Switzerland
Pierre Baylou
Affiliation:
IMS, LAPS Department, CNRS UMR 5218, University of Bordeaux, Université Bordeaux 1, 351 Cours de la Libération, 33405 Talence, France
Christian Germain
Affiliation:
IMS, LAPS Department, CNRS UMR 5218, University of Bordeaux, Université Bordeaux 1, 351 Cours de la Libération, 33405 Talence, France
Jean-Pierre Da Costa*
Affiliation:
IMS, LAPS Department, CNRS UMR 5218, University of Bordeaux, Université Bordeaux 1, 351 Cours de la Libération, 33405 Talence, France
*
Corresponding author. E-mail: jean-pierre.dacosta@ims-bordeaux.fr
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Abstract

We propose an image-based framework to evaluate the uncertainty in the estimation of the volume fraction of specific microstructures based on the observation of a single section. These microstructures consist of cubes organized on a cubic mesh, such as monocrystalline nickel base superalloys. The framework is twofold: a model-based stereological analysis allows relating two-dimensional image observations to three-dimensional microstructure features, and a spatial statistical analysis allows computing approximate confidence bounds while assessing the representativeness of the image. The reliability of the method is assessed on synthetic models. Volume fraction estimation variances and approximate confidence intervals are computed on real superalloy images in the context of material characterization.

Keywords

measurement uncertaintyphase fractionsingle section stereologyspatial statisticsnickel base superalloyscanning electron microscopy
Type
Instrumentation and Software: Development and Applications
Information
Microscopy and Microanalysis , Volume 16 , Issue 3 , June 2010 , pp. 273 - 281
Copyright
Copyright © Microscopy Society of America 2010

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References

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