A relationship between the local microstructure (crystallographic orientation) of a sample and an image from a scanning electron microscope (SEM) has been an elusive goal. Being able to show the structure from an exact area and relate it to other data is essential to the understanding of the structure relationship to the entire sample. Conventionally microtextural information of tapes is obtained by using x-ray diffraction and pole figures. But this only provides information about the global texture. The precise location is not well defined. The ability to physically transfer the sample from the x-ray diffractometer to a SEM and accurately state that this is the same area has been impossible. Electron Backscatter Diffraction Patterns (EBSPs) have been obtained in an electron microscope and the exact area in relation to the rest of the sample is determined. Thus larger areas can be defined and put together to form a composite of an entire sample. This, however, may be hard to accomplish in that defined areas for the image scan may be at a different scale than the EBSP scan. A contrast method of imaging in the ESEM using an increased vacuum and the ESD yields a good correlation to mapped areas obtained from EBSPs or also known as backscatter electron Kikuchi diffraction patterns (BEKPs or BKPs).