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Combined Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

Published online by Cambridge University Press:  20 December 2019

Kenta K. Ohtaki
Affiliation:
Advanced Electron Microscopy Center, Hawai‘i Institute of Geophysics and Planetology, University of Hawai‘i at Mānoa, 1680 East-West Road, Honolulu, HI96822, USA
Hope A. Ishii*
Affiliation:
Advanced Electron Microscopy Center, Hawai‘i Institute of Geophysics and Planetology, University of Hawai‘i at Mānoa, 1680 East-West Road, Honolulu, HI96822, USA
John P. Bradley
Affiliation:
Advanced Electron Microscopy Center, Hawai‘i Institute of Geophysics and Planetology, University of Hawai‘i at Mānoa, 1680 East-West Road, Honolulu, HI96822, USA
*
*Author for correspondence: Hope A. Ishii, E-mail: hope.ishii@hawaii.edu

Abstract

A new transmission electron microscopy (TEM) specimen preparation method that utilizes a combination of focused ion beam (FIB) methods and ultramicrotomy is demonstrated. This combined method retains the benefit of site-specific sampling by FIB but eliminates ion beam-induced damage except at specimen edges and allows recovery of many consecutive sections. It is best applied to porous and/or fine-grained materials that are amenable to ultramicrotomy but are located in bulk samples that are not. The method is ideal for unique samples from which every specimen is precious, and we demonstrate its utility on fine-grained material from the one-of-a-kind Paris meteorite. Compared with a specimen prepared by conventional FIB methods, the final sections are uniformly thin and free from re-deposition and curtaining artifacts common in FIB specimens prepared from porous, heterogeneous samples.

Type
Software and Instrumentation
Copyright
Copyright © Microscopy Society of America 2019

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Combined Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials
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