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Characterization of JEOL 3000f TEM Equipped for Electron Holography

Published online by Cambridge University Press:  02 July 2020

M. A. Schofield  and
Y. Zhu
M. A. Schofield
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton NY 11973
Y. Zhu
Affiliation:
Department of Applied Science, Brookhaven National Laboratory, Upton NY 11973
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Extract

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

Type
Electron Holography
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 228 - 229
Copyright
Copyright © Microscopy Society of America

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References

1.Völkl, E. et al., Eds., Introduction to Electron Holography, New York Plenum (1999).CrossRefGoogle Scholar
2.Wu, L. et al., submitted to Acta Cryst. (2000)Google Scholar
3.Volkov, V. V. and Zhu, Y., in this Microscopy and Microanalysis Proceedings (2000).Google Scholar
4. See, for example, Ladd, M. F. C. and Palmer, R. A., Structure Determination by X-ray Crystallography, New York Plenum (1994).Google Scholar
5. Supplied with the HoloWorks Electron Holography plug-in module for DigitalMicrograph by E. Volkl (1994).Google Scholar
6. This work was supported under US DOE contract No. DE-AC02-98CH10886.Google Scholar