Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Veligura, V
Hlawacek, G
Gastel, R van
Zandvliet, H J W
and
Poelsema, B
2014.
A high resolution ionoluminescence study of defect creation and interaction.
Journal of Physics: Condensed Matter,
Vol. 26,
Issue. 16,
p.
165401.
Veligura, Vasilisa
Hlawacek, Gregor
Jahn, Uwe
van Gastel, Raoul
Zandvliet, Harold J. W.
and
Poelsema, Bene
2014.
Creation and physical aspects of luminescent patterns using helium ion microscopy.
Journal of Applied Physics,
Vol. 115,
Issue. 18,
Hlawacek, Gregor
Veligura, Vasilisa
van Gastel, Raoul
and
Poelsema, Bene
2014.
Helium ion microscopy.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 32,
Issue. 2,
Veligura, Vasilisa
Hlawacek, Gregor
van Gastel, Raoul
Zandvliet, Harold J.W.
and
Poelsema, Bene
2015.
Investigation of ionoluminescence of semiconductor materials using helium ion microscopy.
Journal of Luminescence,
Vol. 157,
Issue. ,
p.
321.
Boden, Stuart A.
2016.
Helium Ion Microscopy.
p.
149.
Veligura, Vasilisa
and
Hlawacek, Gregor
2016.
Helium Ion Microscopy.
p.
325.
Hlawacek, Gregor
2019.
Springer Handbook of Microscopy.
p.
677.
Wirtz, Tom
De Castro, Olivier
Audinot, Jean-Nicolas
and
Philipp, Patrick
2019.
Imaging and Analytics on the Helium Ion Microscope.
Annual Review of Analytical Chemistry,
Vol. 12,
Issue. 1,
p.
523.
Serralta, Eduardo
Klingner, Nico
De Castro, Olivier
Mousley, Michael
Eswara, Santhana
Duarte Pinto, Serge
Wirtz, Tom
and
Hlawacek, Gregor
2020.
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector.
Beilstein Journal of Nanotechnology,
Vol. 11,
Issue. ,
p.
1854.
Audinot, Jean-Nicolas
Philipp, Patrick
De Castro, Olivier
Biesemeier, Antje
Hoang, Quang Hung
and
Wirtz, Tom
2021.
Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope.
Reports on Progress in Physics,
Vol. 84,
Issue. 10,
p.
105901.
Höflich, Katja
Hobler, Gerhard
Allen, Frances I.
Wirtz, Tom
Rius, Gemma
McElwee-White, Lisa
Krasheninnikov, Arkady V.
Schmidt, Matthias
Utke, Ivo
Klingner, Nico
Osenberg, Markus
Córdoba, Rosa
Djurabekova, Flyura
Manke, Ingo
Moll, Philip
Manoccio, Mariachiara
De Teresa, José María
Bischoff, Lothar
Michler, Johann
De Castro, Olivier
Delobbe, Anne
Dunne, Peter
Dobrovolskiy, Oleksandr V.
Frese, Natalie
Gölzhäuser, Armin
Mazarov, Paul
Koelle, Dieter
Möller, Wolfhard
Pérez-Murano, Francesc
Philipp, Patrick
Vollnhals, Florian
and
Hlawacek, Gregor
2023.
Roadmap for focused ion beam technologies.
Applied Physics Reviews,
Vol. 10,
Issue. 4,