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CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image

Published online by Cambridge University Press:  24 July 2020

Guillermo Bárcena-González
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
María de la Paz Guerrero-Lebrero
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
Elisa Guerrero
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
Andres Yañez
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
Bernardo Nuñez-Moraleda
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
Daniel Fernández-Reyes
Affiliation:
Department of Material Science and Metallurgy Engineering and Inorganic Chemistry, University of Cádiz, Puerto Real, Cádiz, Spain
Pedro Real
Affiliation:
Department of Applied Mathematics I, University of Seville, Seville, Spain
David González
Affiliation:
Department of Material Science and Metallurgy Engineering and Inorganic Chemistry, University of Cádiz, Puerto Real, Cádiz, Spain
Pedro L. Galindo
Affiliation:
Department of Computer Science and Engineering, University of Cádiz, Puerto Real, Cádiz, Spain
Corresponding
E-mail address:

Abstract

In this work, a new method to determine and correct the linear drift for any crystalline orientation in a single-column-resolved high-resolution scanning transmission electron microscopy (HR-STEM) image, which is based on angle measurements in the Fourier space, is presented. This proposal supposes a generalization and the improvement of a previous work that needs the presence of two symmetrical planes in the crystalline orientation to be applicable. Now, a mathematical derivation of the drift effect on two families of asymmetric planes in the reciprocal space is inferred. However, though it was not possible to find an analytical solution for all conditions, a simple formula was derived to calculate the drift effect that is exact for three specific rotation angles. Taking this into account, an iterative algorithm based on successive rotation/drift correction steps is devised to remove drift distortions in HR-STEM images. The procedure has been evaluated using a simulated micrograph of a monoclinic material in an orientation where all the reciprocal lattice vectors are different. The algorithm only needs four iterations to resolve a 15° drift angle in the image.

Type
Software and Instrumentation
Copyright
Copyright © Microscopy Society of America 2020

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References

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