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Analysis of Asbestos Fibres in The Scanning Electron Microscope (SEM) by The Use of Electron Backscattering Diffraction (Ebsd).

Published online by Cambridge University Press:  02 July 2020

M. Raanes
Affiliation:
Department of Metallurgy, The Norwegian University of Science and Technology, N-7034, Trondheim, Norwa
J. Hjelen
Affiliation:
The Royal Norwegian Air Force Academy, N-7004, Trondheim, Norway
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Extract

Asbestos is a common name of a number of fibrous mineral silicates which differ in chemical composition. The asbestos fibres are classified into two groups: serpentine (chrysotile) and amphiboles (anthophyllite, amosite, actinolite, tremolite, crocidolite).

Inhalation of asbestos dust fibres involves a health risk. It is therefore of great importance to develop quick and reliable methods to check for the presence of asbestos fibres in suspected materials. Some common analysis methods for asbestos detection are: optical microscopy scanning or transmission electron microscopies (SEM ,TEM) often combined with energy dispersive X-ray analysis (EDX) and selected area electron diffraction (SAED) in the TEM where the crystal structure is determined.

The EBSD technique in the SEM has in this work been applied to achieve electron backscattering patterns (EBSP) from four types of asbestos fibres. The pattern quality has been studied as a function of specimen preparation and SEM settings.

Type
Geology and Mineralogy
Copyright
Copyright © Microscopy Society of America 1997

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References

Cam, D. and Staiano, M., Microscopy and analysis,EE 44(1996)25Google Scholar
Middelton, A.P. and Jackson, E.A., Ann.occup.Hyg., 25(1982),381Google Scholar
Venables, J.A. and Harland, C.J., Phil.Mag. 27(1973)119310.1080/14786437308225827CrossRefGoogle Scholar
Hjelen, J.et al., Materials Science Forum Vol. 157–162,(1994)137.10.4028/www.scientific.net/MSF.157-162.137CrossRefGoogle Scholar