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The 4D Camera: Very High Speed Electron Counting for 4D-STEM

Published online by Cambridge University Press:  05 August 2019

Jim Ciston*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Ian J. Johnson
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Brent R. Draney
Affiliation:
National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory Berkeley, California, USA.
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Erin Fong
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Azriel Goldschmidt
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
John M. Joseph
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Jason R. Lee
Affiliation:
National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory Berkeley, California, USA.
Alexander Mueller
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Ashwin Selvarajan
Affiliation:
National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory Berkeley, California, USA.
David E. Skinner
Affiliation:
National Energy Research Scientific Computing Center, Lawrence Berkeley National Laboratory Berkeley, California, USA.
Thorsten Stezelberger
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Craig S. Tindall
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Andrew M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA. Department of Materials Science and Engineering, University of California, Berkeley, California, USA.
Peter Denes
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, USA.
*
*Corresponding author: JCiston@lbl.gov
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Nellist, PD, McCallum, BC and Rodenburg, JM, Nature 374 (1995), p. 630.CrossRefGoogle Scholar
[2]Ozdol, VB et al. , Applied Physics Letters 106 (2015), p. 253107.CrossRefGoogle Scholar
[3]Ophus, C et al. , Applied Physics Letters 110 (2017), p. 063102.CrossRefGoogle Scholar
[4]Tate, MW et al. , Microscopy & Microanalysis 22 (2016), p. 237.CrossRefGoogle Scholar
[5]Johnson, IJ et al. , Microscopy & Microanalysis 24 (S1) (2018), p. 166.CrossRefGoogle Scholar
[6]Battaglia, M et al. , Nucl. Inst. and Methods in Phys. Res. A 622(3) (2010), p. 669.CrossRefGoogle Scholar
[7]Ophus, C et al. , Nature Communications 7 (2016), p. 10719.CrossRefGoogle Scholar
[8]This work was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. Research was performed at the Molecular Foundry and the National Energy Research Scientific Computing Center, DOE Office of Science User Facilities. JC and CO acknowledge support from the DOE Early Career Research Program.Google Scholar
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The 4D Camera: Very High Speed Electron Counting for 4D-STEM
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