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3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

J. Lin ,
W. Heeschen ,
J. Reffner  and
J. Hook
J. Lin
Affiliation:
The Dow Chemical Company, Analytical Sciences, Midland, MI
W. Heeschen
Affiliation:
The Dow Chemical Company, Analytical Sciences, Midland, MI
J. Reffner
Affiliation:
The Dow Chemical Company, Spring House Technical Center, Spring House, PA
J. Hook
Affiliation:
The Dow Chemical Company, Spring House Technical Center, Spring House, PA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 614 - 615
Copyright
Copyright © Microscopy Society of America 2012

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