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3D Atom Probe and SIMS as complementary techniques for the observation and quantitative measurement of microstructures

Published online by Cambridge University Press:  03 August 2008

L Renaud ,
I Martin ,
F Hillion ,
F Horreard ,
YS Yang ,
JS Kang  and
CG Park
L Renaud
Affiliation:
CAMECA, France
I Martin
Affiliation:
CAMECA, France
F Hillion
Affiliation:
CAMECA, France
F Horreard
Affiliation:
CAMECA, France
YS Yang
Affiliation:
Pohang University of Science and Technology, Korea
JS Kang
Affiliation:
Pohang University of Science and Technology, Korea
CG Park
Affiliation:
Pohang University of Science and Technology, Korea
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1232 - 1233
Copyright
© 2008 Microscopy Society of America

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