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A 331-Beam Scanning Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Stephan Nickell  and
Dirk Zeidler
Stephan Nickell
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss-Str. 22, D-73447 Oberkochen, Germany
Dirk Zeidler*
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss-Str. 22, D-73447 Oberkochen, Germany
*
*Corresponding author: dirk.zeidler@zeiss.com

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 568 - 569
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Eberle, A. L., et al. , J. Microsc. 259, p.114 (2015) [doi:10.1111/jmi.12224]Google Scholar
[2]Kemen, T., et al. , Proc. SPIE, 94241U (2015) [doi:10.1117/12.2188560]Google Scholar