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Microscopy characterization of doped fibers

Published online by Cambridge University Press:  01 July 2004

M. MILANI ,
D. BATANI ,
M. BALLERINI ,
A. POZZI  and
C. SAVOIA
M. MILANI
Affiliation:
Università degli Studi di Milano Bicocca, Italy
D. BATANI
Affiliation:
Università degli Studi di Milano Bicocca, Italy
M. BALLERINI
Affiliation:
Università degli Studi di Milano Bicocca, Italy
A. POZZI
Affiliation:
Università degli Studi di Milano Bicocca, Italy
C. SAVOIA
Affiliation:
Sgs-Thomson, Central Research and Development, Agrate Brianza, Italy
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Abstract

The use of the Soft X-ray Contact Microscopy technique is discussed as a possible new tool to get information on dopant distribution in the core of single-mode optical fibers with 50 nm spatial resolution.

Keywords

Dopant constrationOptical fibersX-ray microscopy
Type
Research Article
Information
Laser and Particle Beams , Volume 22 , Issue 3 , July 2004 , pp. 351 - 354
Copyright
© 2004 Cambridge University Press

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References

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