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Low microdivergence medium-mass ion beam produced from a N2O cryogenic diode

Published online by Cambridge University Press:  18 January 2002

KOICHI KASUYA ,
YOHSUKE KISHI ,
TAKAHIRO KAMIYA  and
MASATO FUNATSU
KOICHI KASUYA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama, Kanagawa, Japan 226-8502
YOHSUKE KISHI
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama, Kanagawa, Japan 226-8502
TAKAHIRO KAMIYA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama, Kanagawa, Japan 226-8502
MASATO FUNATSU
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta 4259, Midori-ku, Yokohama, Kanagawa, Japan 226-8502
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Abstract

Medium-mass ion beams including nitrogen and oxygen were produced from a cryogenic diode with N2O ice as the ion source. The nominal diode voltage was 300–400 kV, and the peak ion current was 240 A. The beam divergence angle was measured with a five-aperture time-integrated pinhole camera. The five camera images were analyzed to estimate the spatial distribution of the beam source divergence angle along the anode radius, yielding a value of 5–6 mrad for the average microdivergence. This is low enough for this ion source to be studied further in the near future. If possible, we want to consider this as one of the probable candidate ion sources for ion beam drivers for future inertial confinement fusion (ICF) and inertial fusion energy (IFE) applications.

Keywords

Microdivergent angleNitrogen ion beamCryogenic diodeArrayed pinhole cameraSolid-state track detector
Type
Research Article
Information
Laser and Particle Beams , Volume 19 , Issue 2 , April 2001 , pp. 309 - 316
Copyright
© 2001 Cambridge University Press

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