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Valence states analysis of Ca and Si in CaSi2 during CaSi2–H2O reaction

Published online by Cambridge University Press:  31 January 2011

S. Abe ,
H. Nakayama ,
T. Nishino  and
S. Iida
S. Abe
Affiliation:
Graduate School of Science and Technology, and Faculty of Engineering, Kobe University, 1–1 Rokkoudai, Nada-ku, Kobe 657–8501, Japan
H. Nakayama
Affiliation:
Graduate School of Science and Technology, and Faculty of Engineering, Kobe University, 1–1 Rokkoudai, Nada-ku, Kobe 657–8501, Japan
T. Nishino
Affiliation:
Graduate School of Science and Technology, and Faculty of Engineering, Kobe University, 1–1 Rokkoudai, Nada-ku, Kobe 657–8501, Japan
S. Iida
Affiliation:
Department of Electrical Electronics and Engineering, Osaka Sangyo University, 3-1-1, Nakagaito, Daito, Osaka 574-0013, Japan
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Abstract

The changes in the valence electron states of CaSi2 during the chemical reaction with H2O have been investigated by Auger Valence Electron Spectroscopy (AVES). In order to study the reaction process, the reaction was precisely controlled by applying dc voltage between Pt electrode and CaSi2 specimen. The Si[2s, 2p,V] Auger spectra of CaSi2 specimen remain unchanged under the applied voltage lower than −15 V relative to the Pt electrode in H2O. At higher applied voltage, 3p components of Si[2s, 2p, V] (V = 3s, 3p) Auger spectra get weak while the 3s components increase drastically. The peak position due to Ca[2p, 3p, 3p] transitions gradually shifted toward the lower energy side by raising the applied voltage. The peak shift is due to the formation of Ca–O bonds in CaSi2. A new peak, which arises from the split of the valence electron states in Ca atoms due to the Ca–O bonds, appeared in Ca[2p, 3p,V] Auger spectra for CaSi2 after the reaction with H2O.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 5 , May 1998 , pp. 1401 - 1404
Copyright
Copyright © Materials Research Society 1998

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References

1.Fahy, S. and Hamann, R., Phys. Rev. B 41, 7587 (1990).CrossRefGoogle Scholar
2.Walle, C. G. Van de, Phys. Rev. B 43, 11 913 (1991).CrossRefGoogle Scholar
3.Well, A. F., Structural Inorganic Chemistry (Oxford Univ., Oxford, 1962), p. 773.Google Scholar
4.Matunaga, Y., Bunsi To Kessho (Molecular and Crystal) (Shokabo, Tokyo, 1965), p. 146 (in Japanese).Google Scholar
5.Hirabayashi, I., Kotaibuturi (Solid State Physics) 17, 681 (1982) (in Japanese).Google Scholar
6.Kulatov, E., Nakayama, H., and Ohta, H., J. Phys. (in press).Google Scholar
7.Bisi, O., in Auger Spectroscopy and Electronic Structure, edited by Cubiotti, G., Mondio, G., and Wandelt, K. (Springer, Berlin, 1989), p. 30.CrossRefGoogle Scholar
8.Sancrotti, M., Vescovo, E., Calliari, L., and Marchetti, F., in Auger Spectroscopy and Electronic Structure, edited by Cubiotti, G., Mondio, G., and Wandelt, K. (Springer, Berlin, 1989), p. 116.CrossRefGoogle Scholar
9.Sancrotti, M. and Rizzi, A., Phys. Rev. B 37, 3120 (1988).CrossRefGoogle Scholar
10.Sancrotti, M., Abbati, I., Rizzi, A., Calliari, L., Marchetti, F., and Bisi, O., Surf. Sci. 189/190, 300 (1987).CrossRefGoogle Scholar
11.Calliari, L., Marchetti, F., Sancrotti, M., Bisi, O., Iandelli, A., Olcese, G. L., and Palenzona, A., Phys. Rev. B 41, 7569 (1990).CrossRefGoogle Scholar
12.Bisi, O., Braicovich, L., Carbone, C., Lindau, I., Iandelli, A., Olcese, G. L., and Palenzona, A., Phys. Rev. B 40, 10 194 (1989).CrossRefGoogle Scholar
13.Fujita, H., Fuchida, Y., and Nakayama, H., Philos. Mag. A 59, 873 (1989).CrossRefGoogle Scholar
14.Yasuda, H., Nakayama, H., and Fujita, H., Jpn. J. Appl. Phys. 28, 2234 (1989).CrossRefGoogle Scholar
15.Ueda, K., Nakayama, H., Sekine, M., and Fujita, H., Vacuum 42, 547 (1991).CrossRefGoogle Scholar
16.Nakayama, H., Nishino, T., Ueda, K., Takeno, S., and Fujita, H., Ultramicroscopy 39, 329 (1991).CrossRefGoogle Scholar
17.Fujiwara, Y., Hirata, S., Nishikubo, M., Kobayashi, T., Nakayama, H., and Fujita, H., IEEE Trans. Magn. 27, 1166 (1991).CrossRefGoogle Scholar
18.Abe, S., Nakayama, H., Nishino, T., and Iida, S., J. Mater. Res. 12, 407 (1997).CrossRefGoogle Scholar
19. Y. Shibata and Kimura, K., Mukikagakuzensho X II-2 keiso (Complete books of inorganic chemistry X II-2 Silicon) (Maruzen, Tokyo, 1986), p. 315 (in Japanese).Google Scholar
20.Abe, S., Nakayama, H., Nishino, T., and Iida, S., Appl. Surf. Sci (in press).Google Scholar
21.Yamanaka, S., Suehiro, F., Sasaki, K., and Hattori, M., Physica 105B, 230 (1981).Google Scholar