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Synthesis, crystal structure, and thermoelectric properties of a new layered carbide (ZrC)3[Al3.56Si0.44]C3

Published online by Cambridge University Press:  31 January 2011

Koichiro Fukuda ,
Miyuki Hisamura ,
Yusuke Kawamoto  and
Tomoyuki Iwata
Koichiro Fukuda*
Affiliation:
Department of Environmental and Materials Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan
Miyuki Hisamura
Affiliation:
Department of Environmental and Materials Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan
Yusuke Kawamoto
Affiliation:
Department of Environmental and Materials Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan
Tomoyuki Iwata
Affiliation:
Department of Environmental and Materials Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan
*
a)Address all correspondence to this author. e-mail: fukuda.koichiro@nitech.ac.jp
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Abstract

A new quaternary layered carbide, (ZrC)3[Al3.56Si0.44]C3, has been synthesized and characterized by x-ray powder diffraction and thermopower and electrical conductivity measurements. The crystal structure was successfully determined using direct methods and further refined by the Rietveld method. The crystal is trigonal (space group R3m*, Z = 3) with lattice dimensions a = 0.331389(7), c = 4.90084(7) nm, and V = 0.46610(1) nm3. The final reliability indices calculated from the Rietveld refinement were Rwp = 9.53% (S = 1.70), Rp = 7.22%, RB = 1.81%, and RF = 0.94%. The crystal structure is composed of the NaCl-type [Zr3C4] slabs separated by the Al4C3-type [Al0.89Si0.11C] layers. This material had thermoelectric properties comparable to the layered carbides (ZrC)2[Al3.56Si0.44]C3 (Zr2[Al3.56Si0.44]C5), (ZrC)2Al3C2, and (ZrC)3Al3C2 in the temperature range of 373–1273 K, with the maximal power-factor value of 6.6 × 10−5 W m−1K−2 at 545 K. The two quaternary carbides have been found to form a homologous series with the general formula of (ZrC)n[Al3.56Si0.44]C3 (n = 2 and 3).

Keywords

Crystallographic structureX-ray diffraction (XRD)Thermoelectricity
Type
Articles
Information
Journal of Materials Research , Volume 22 , Issue 10 , October 2007 , pp. 2888 - 2894
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1Schuster, J.C.Nowotny, H.: Investigations of the ternary systems (Zr, Hf, Nb, Ta)–Al–C and studies on complex carbides. Z. Metallkd. 71, 341 1980Google Scholar
2Gesing, Th.M.Jeitschko, W.: The crystal structure of Zr3Al3C5, ScAl3C3, and UAl3C3 and their relation to the structure of U2Al3C4 and Al4C3. J. Solid State Chem. 140, 396 1998CrossRefGoogle Scholar
3Fukuda, K., Mori, S.Hashimoto, S.: Crystal structure of Zr2Al3C4. J. Am. Ceram. Soc. 88, 3528 2005CrossRefGoogle Scholar
4Kidwell, B.L., Oden, L.L.McCune, R.A.: 2Al4C3·SiC: A new intermediate phase in the Al–Si–C system. J. Appl. Crystallogr. 17, 481 1984CrossRefGoogle Scholar
5Fukuda, K., Hisamura, M., Iwata, T., Tera, N.Sato, K.: Synthesis, crystal structure and thermoelectric properties of a new carbide Zr2[Al3.56Si0.44]C5. J. Solid State Chem. 180, 1809 2007CrossRefGoogle Scholar
6Hicks, L.D.Dresselhaus, M.S.: Effect of quantum-well structures on the thermoelectric figure of merit. Phys. Rev. B 47, 12727 1993CrossRefGoogle ScholarPubMed
7Hicks, L.D.Dresselhaus, M.S.: Thermoelectric figure of merit of a one-dimensional conductor. Phys. Rev. B 47, 16631 1993CrossRefGoogle ScholarPubMed
8Hicks, L.D., Harman, T.C.Dresselhaus, M.S.: Use of quantum-well superlattices to obtain a high figure of merit from nonconventional thermoelectric materials. Appl. Phys. Lett. 63, 3230 1993CrossRefGoogle Scholar
9Koumoto, K., Koduka, H.Seo, W-S.: Thermoelectric properties of single crystal CuAlO2 with a layered structure. J. Mater. Chem. 11, 251 2001CrossRefGoogle Scholar
10Yasukawa, M., Ikeuchi, K., Kono, T., Ueda, K.Hosono, H.: Thermoelectric properties of delafossite-type layered oxides AgIn1−xSnxO2. J. Appl. Phys. 98, 013706/1 2005CrossRefGoogle Scholar
11Mori, T.Nishimura, T.: Thermoelectric properties of homologous p- and n-type boron-rich borides. J. Solid State Chem. 179, 2908 2006CrossRefGoogle Scholar
12Fukuda, K.Hisamura, M.: Crystal structure and thermoelectric properties of YAl3C3. J. Am. Ceram. Soc. (in press)Google Scholar
13Izumi, F.Dilanian, R.A.: VENUS: A 3D visualization system for crystal structures and electron nuclear densities. IUCr Newslett. 32, 59 2005Google Scholar
14Gelato, L.M.Parthé, E.: STRUCTURE TIDY—A computer program to standardize crystal structure data. J. Appl. Crystallogr. 20, 139 1987CrossRefGoogle Scholar
15Pawley, G.S.: Unit-cell refinement from powder diffraction scans. J. Appl. Crystallogr. 14, 357 1981CrossRefGoogle Scholar
16Toraya, H.: Whole-powder-pattern fitting without reference to a structural model: Application to x-ray powder diffractometer data. J. Appl. Crystallogr. 19, 440 1986CrossRefGoogle Scholar
17Altomare, A., Burla, M.C., Camalli, M., Carrozzini, B., Cascarano, G.L., Giacovazzo, C., Guagliardi, A., Moliterni, A.G.G., Polidori, G.Rizzi, R.: EXPO program for full powder pattern decomposition and crystal structure solution. J. Appl. Crystallogr. 32, 339 1999CrossRefGoogle Scholar
18The Rietveld Method,edited by R.A. Young (Oxford University Press, Oxford, UK,1993 1, 38Google Scholar
19Izumi, F.Ikeda, T.: A Rietveld-analysis program RIETAN-98 and its applications to zeolites. Mater. Sci. Forum 321–324, 198 2000CrossRefGoogle Scholar
20Toraya, H.: Array-type universal profile function for powder pattern fitting. J. Appl. Crystallogr. 23, 485 1990CrossRefGoogle Scholar
21Dollase, W.A.: Correction of intensities for preferred orientation in powder diffractometry: application of the march model. J. Appl. Crystallogr. 19, 267 1986CrossRefGoogle Scholar
22Brindley, G.W.: Quantitative x-ray analysis of crystalline substances or phases in their mixtures. Bull. Soc. Chim. Fr. D591949Google Scholar
23Gesing, Th.M.Jeitschko, W.: The crystal structure and chemical properties of U2Al3C4 and structure refinement of Al4C3. Z. Naturforsch. 50B, 196 1995CrossRefGoogle Scholar