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Relaxation of ultraviolet-radiation-induced structure and long-lasting phosphorescence in Eu2+-doped strontium aluminosilicate glasses

Published online by Cambridge University Press:  31 January 2011

Jianrong Qiu*
Affiliation:
Photoncraft Project, Japan Science and Technology Corporation, Keihanna Plaza, Seika-cho, Kyoto 619–0237, Japan
Y. Shimizugawa
Affiliation:
Department of Optical Materials, Osaka National Research Institute, Osaka 563–0026, Japan
K. Kojima
Affiliation:
Faculty of Science and Engineering, Ritsumeikan University, Shiga 525–8577, Japan
K. Tanaka
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 606–8501, Japan
K. Hirao
Affiliation:
Department of Material Chemistry, Graduate School of Engineering, Kyoto University, Kyoto 606–8501, Japan
*
a)Address all correspondence to this author. e-mail: jrq@photon.jst.go.jp
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Abstract

We report on the relaxation of ultraviolet-radiation-induced structure and long-lasting phosphorescence in Eu2+-doped glass samples with compositions of xAl2O3 · 40SrO · (60 − x)SiO2· 0.05Eu2O2 · 0.05Dy2O3 (x = 0, 10, 30) (mol%). After irradiation by an ultraviolet lamp (λmax = 254nm) with a power density of 5 mW/cm2 for 30 min, a visible light (peaking at 510 nm) could be seen with the unaided eye in the dark even 24 h after the removal of the activating light. Thermostimulated luminescence glow curves, x-ray absorption, and electron-spin-resonance spectra were measured. We suggest that the long-lasting phosphorescence in the Eu2+-doped glass samples resulted from the recombination of electrons and holes at shallow traps in the glass matrix that can be thermally released at room temperature, and energy transfer between the recombination centers and Eu2+ ions.

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Articles
Copyright
Copyright © Materials Research Society 2001

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References

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