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Quantification and control of the sulfur c(2 × 2) superstructure on {100}〈100〉 Ni for optimization of YSZ, CeO2, and SrTiO3 seed layer texture

Published online by Cambridge University Press:  31 January 2011

C. Cantoni ,
D. K. Christen ,
L. Heatherly ,
M. M. Kowalewski ,
F. A. List ,
A. Goyal ,
G. W. Ownby ,
D. M. Zehner ,
B. W. Kang  and
D. M. Kroeger
C. Cantoni
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D. K. Christen
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
L. Heatherly
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
M. M. Kowalewski
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
F. A. List
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
G. W. Ownby
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D. M. Zehner
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
B. W. Kang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D. M. Kroeger
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
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Abstract

We investigated the influence of a chemisorbed S template with c(2 × 2) structure on the epitaxial growth of different oxide buffer layers on {100}〈100〉 Ni. The sulfur superstructure spontaneously forms on the Ni surface during the texturing anneal as a consequence of segregation. However, depending on the initial S bulk concentration and/or specific annealing conditions, the S layer can cover less than the entire substrate's surface. We show that an incomplete c(2 × 2) coverage causes degradation of the seed buffer layer texture as compared to the substrate texture. A simple step consisting of an H2S predeposition anneal can be used to control the superstructure coverage and optimize the seed layer texture.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 10 , October 2002 , pp. 2549 - 2554
Copyright
Copyright © Materials Research Society 2002

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References

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