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Multidimensional SPM applied for nanoscale conductance mapping

Published online by Cambridge University Press:  20 December 2013

James L. Bosse Open the ORCID record for James L. Bosse [Opens in a new window] ,
Ilja Grishin ,
Oleg V. Kolosov  and
Bryan D. Huey
James L. Bosse
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut 06269-3136
Ilja Grishin
Affiliation:
Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom
Oleg V. Kolosov
Affiliation:
Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom
Bryan D. Huey*
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut 06269-3136
*
a)Address all correspondence to this author. e-mail: bhuey@ims.uconn.edu
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Abstract

A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage (I–V) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I–V measurements, but acquired hundreds of times faster. Although similar to current imaging tunneling spectroscopy in a scanning tunneling microscope, the NCM technique does not require conducting specimens. It is therefore a promising approach for efficient, quantitative electronic investigations of heterogeneous materials used in sensors, resistive memories, and photovoltaics.

Keywords

AFMc-AFMPCMnanoscaleconductance
Type
Articles
Information
Journal of Materials Research , Volume 28 , Issue 24 , 28 December 2013 , pp. 3311 - 3321
Copyright
Copyright © Materials Research Society 2013 

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References

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