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Fabrication of a 33-layer optical reflection filter with stepwise graded refractive index profiles
Published online by Cambridge University Press: 31 January 2011
Abstract
A novel optical multilayer filter characterized by symmetrically stepwise graded refractive index profiles and high optical performance was designed. This 33-layer TiO2–SiO2 filter was fabricated by helicon plasma sputtering. The prepared filter exhibited a sharp cutoff reflection band around the central wavelength of 1340 nm and wide pass regions with high transmittance. These results correspond well with calculated estimations. Symmetrically stepwise graded refractive index profiles were demonstrated to effectively contribute to suppression of the sidelobes and to be potentially applicable in the design of other filters.
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