Hostname: page-component-7479d7b7d-k7p5g Total loading time: 0 Render date: 2024-07-12T07:45:28.951Z Has data issue: false hasContentIssue false
  • English
  • Français

Erratum: “Electronic transport and microstructure in MoSi2 thin films” [J. Mater. Res. 1, 493 (1986)]

Published online by Cambridge University Press:  31 January 2011

T.L. Martin  and
J.E. Mahan
T.L. Martin
Affiliation:
Department of Electrical Engineering and Condensed Matter Sciences Laboratory, Colorado State University, Fort Collins, Colorado 80523
J.E. Mahan
Affiliation:
Department of Electrical Engineering and Condensed Matter Sciences Laboratory, Colorado State University, Fort Collins, Colorado 80523

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Errata
Information
Journal of Materials Research , Volume 1 , Issue 5 , October 1986 , pp. 733
Copyright
Copyright © Materials Research Society 1986