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Electron microscopy of high-temperature and high-pressure as-grown diamond crystals

Published online by Cambridge University Press:  31 January 2011

Long-Wei Yin ,
Mu-Sen Li ,
Jian-Jun Cui ,
Bin Xu ,
Jian-Hong Gong ,
Zhao-Yin Hao  and
Jiong-Fa Zhang
Long-Wei Yin*
Affiliation:
School of Materials Science and Engineering, Shandong University, 73 Jing Shi Road, Jinan 250061, People's Republic of China
Mu-Sen Li
Affiliation:
School of Materials Science and Engineering, Shandong University, 73 Jing Shi Road, Jinan 250061, People's Republic of China
Jian-Jun Cui
Affiliation:
School of Materials Science and Engineering, Shandong University, 73 Jing Shi Road, Jinan 250061, People's Republic of China
Bin Xu
Affiliation:
School of Materials Science and Engineering, Shandong University, 73 Jing Shi Road, Jinan 250061, People's Republic of China
Jian-Hong Gong
Affiliation:
School of Materials Science and Engineering, Shandong University, 73 Jing Shi Road, Jinan 250061, People's Republic of China
Zhao-Yin Hao
Affiliation:
National Key Laboratory for Superhard Materials, Jilin University, Changchun 130012, People's Republic of China
Jiong-Fa Zhang
Affiliation:
Occupational College, Shandong University of Science and Technology, Jinan, 271021, People's Republic of China
*
a) Address all correspondence to this author. e-mail: yinlw@sdu.edu.cn
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Abstract

Electron microscopy was used to investigate microstructures of diamond single crystals prepared at high temperature and high pressure (HPHT) from the Fe–Ni–C system. Analysis through selected-area electron diffraction pattern suggests that the crystal structure of the HPHT-grown diamond is cubic; polycrystalline diamonds are contained in the diamond. Etch pits on the (111) surface of the diamond by scanning electron microscopy revealed the dislocation motion under the action of applied stress. An array of parallel dislocation lines taken with reflection of [110] was observed directly by transmission electron microscopy (TEM). Fringe distortions and concentric dislocation loops were examined by rotation moiré images, which arose from two overlapping (111) close-packed planes rotated with respect to each other at a 5° angle. The parallel dislocation lines, distorted fringes, and concentric dislocation loops might have derived from the micro-inclusions. The parallel layers with growth cellular interface by TEM provided direct evidence that the diamond grew from solution of carbon in the molten catalyst at HPHT and the growth interface diamond was not stable.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 16 , Issue 11 , November 2001 , pp. 3023 - 3026
Copyright
Copyright © Materials Research Society 2001

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