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Effect of host compositions on the afterglow properties of phosphorescent strontium aluminate phosphors derived from the sol-gel method

Published online by Cambridge University Press:  31 January 2011

I-Cherng Chen
Affiliation:
Department of Applied Chemistry, National Chiao Tung University, Hsinchu 30050, Taiwan
Teng-Ming Chen*
Affiliation:
Department of Applied Chemistry, National Chiao Tung University, Hsinchu 30050, Taiwan
*
a)Address all correspondence to this author. e-mial: tmchen@cc.nctu.edu.tw
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Abstract

The effect of compositions of host precursors on the afterglow and phosphorescent decay properties of Eu2+- and Dy3+-coactivated strontium aluminates (SAED) synthesized by a sol-gel process has been investigated. A variety of strontium aluminates such as Sr3Al2O6, SrAl2O4, and SrAl12O19 have been identified in the samples prepared from starting precursors with Al/Sr ratios ranging from 1 to 12, respectively. The initial afterglow intensity (I0) for SAED phases was found to vary with Al/Sr ratio of the sol-gel precursor, with a maximal I0 appearing in the sample with Al/Sr of 2 in which SrAl2O4 dominated. The afterglow decay rate was found to be fastest for sample with Al/Sr ratio of 1:1 in which Sr3Al2O6 phase dominated. Moreover, the afterglow decay rates for those with Al/Sr ratio of 2:1 to 12:1, in which SrAl2O4 and SrAl12O19 dominated, were found to be slow and similar.

Type
Articles
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Schulze, V.A-R. and Müller-Buschbauch, Hk., Z. Anorg. Allg. Chem. 475, 205 (1981).Google Scholar
2.Murayama, Y., Takeuchi, N., Aoki, Y., and Matsuzawa, T., U.S. Patent 5 424 006 (1995).Google Scholar
3.Matsuzawa, T., Aoki, Y., Takeuchi, N., and Murayama, Y., J. Electrochem. Soc. 143, 2670 (1996).CrossRefGoogle Scholar
4.Katsumata, T., Nabae, T., Sasajima, K., Kumuro, S., and Morikawa, T., J. Am. Ceram. Soc. 81, 413 (1998).Google Scholar
5.Katsumata, T., Nabae, T., Sasajima, K., Kumuro, S., and Morikawa, T., J. Electrochem. Soc. 144, L243 (1997).Google Scholar
6.Yamamoto, H. and Matsuzawa, T., J. Lumin. 72–74, 287 (1997).CrossRefGoogle Scholar
7.Jia, W., Yuan, H., Lu, L., Liu, H., and Yen, W.M., J. Lumin. 76, 77, 424 (1998).Google Scholar
8.Sakai, R., Katsumata, T., Komuro, S., and Morikawa, T., J. Lumin. 85, 149 (1999).CrossRefGoogle Scholar
9.Nakazawa, E. and Mochida, T., J. Lumin. 72–74, 236 (1997).CrossRefGoogle Scholar
10.Zhang, T. and Su, Q., J. Soc. Inform. Display 8, 27 (2000).Google Scholar
11.Yuan, H.B., Jia, W., Basum, S.A., Lu, L., Meltzer, R.S., and Yen, W.M., J. Electrochem. Soc. 147, 3154 (2000).Google Scholar
12.Chen, I-C. and Chen, T-M., J. Mater. Res. 16, 644 (2001).Google Scholar
13.Lange, H., U.S. Patent 3,294,699 (1966).Google Scholar
14.Sirazhiddinov, N.A. and Arifov, P.A., Russ. J. Inorg. Chem. 16, 40 (1971).Google Scholar
15.Pet, R.J., van den Nieuwenhof, M., and Duisters, J.P.H.M., U.S. Patent 4,795,588 (1989).Google Scholar
16.Nass, R. and Schmidt, H., J. Non-Cryst. Solids 121, 329 (1990).CrossRefGoogle Scholar
17. Powder Diffraction File, Card Nos. 24–1187 (Sr3Al2O6), 34–0379 (SrAl2O4), and 26–0976 (SrAl12O19), Joint Committee on Powder Diffraction Standards (JCPDS) (1999).Google Scholar
18.Phase Diagrams for Ceramists (American Ceramic Society, Columbus, OH, 1987), Vol.I, Fig. 294, and Vol. VI, Fig. 6427.Google Scholar
19.Sun, J.Y., Shi, C.S., and Li, Y.M., Chin. Sci. Bull. 34, 703 (1989).Google Scholar
20.Qiu, J., Miura, K., Sugimoto, N., and Hirao, K., J. Non-Cryst. Solids 213, 214, 266 (1997).Google Scholar
21.Ohta, M., Maruyama, M., Hayakawa, T., and Nishijo, T., J. Ceram. Soc. Jpn. 108, 284 (2000).Google Scholar