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Effect of drop impact energy on contact resistance of anisotropic conductive adhesive film joints

Published online by Cambridge University Press:  03 March 2011

Rashed Adnan Islam ,
Y.C. Chan  and
B. Ralph
Rashed Adnan Islam
Affiliation:
Department of Electronic Engineering, City University of Hong Kong, Kowloon Tong, Kowloon, Hong Kong
Y.C. Chan*
Affiliation:
Department of Electronic Engineering, City University of Hong Kong, Kowloon Tong, Kowloon, Hong Kong
B. Ralph
Affiliation:
Faculty of Technology and Information Systems, Brunel University, Uxbridge, Middlesex UB8 3PH, United Kingdom
*
a) Address all correspondence to this author. e-mail: EEYCCHAN@cityu.edu.hk
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Abstract

The contact resistances investigated in this study of anisotropic conductive adhesive film joints using Au/Ni bumps and flexible substrates are found to be increased by the drop impact energy and also by the combined effect of heat/humidity and the impact energy. The samples humidified at 85 °C/85% RH for 384 h, on which impact energy of 50 J was induced, exhibit the most severe results. The contact resistance increases by 700%, which had been about 0.062 Ω in the as-bonded condition. The samples without humidification showed a sluggish and gentle increase in contact resistance with induced drop impact energy. The contact resistance was found to be increased by 400% after absorbing 90 J energy. Scanning electron microscopy images show particle deformation due to abrasion and friction between the contacting surfaces resulting from the sudden impact. Joints are also observed with no connections, which signify open circuits. Almost 25% of circuits were found open in the samples (after 384 h in a humid environment), which have suffered severe mechanical shock. Breaking of the conductive layer of the particle and exposing the underlying polymeric portion was also observed.

Keywords

Microelectic packagingAdhesiveInternal friction
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 6 , June 2004 , pp. 1662 - 1668
Copyright
Copyright © Materials Research Society 2004

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References

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