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Deposition and mechanical properties of polycrystalline Y2O3/ZrO2 superlattices

Published online by Cambridge University Press:  31 January 2011

Philip C. Yashar ,
Scott A. Barnett ,
Lars Hultman  and
William D. Sproul
Philip C. Yashar
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208
Scott A. Barnett
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208
Lars Hultman
Affiliation:
Thin Film Physics Division, Department of Physics, Linköping University, S-581 83 Linköping, Sweden
William D. Sproul
Affiliation:
Advanced Coatings Technology Group, Northwestern University, Evanston, Illinois 60201
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Abstract

Polycrystalline Y2O3/ZrO2 superlattice thin films were deposited using opposedcathode reactive magnetron sputtering. Pulsed direct-current power was used to eliminate arcing on the metallic targets. Radio-frequency power was applied to the substrates to achieve ion bombardment of the growing film. In order to reproducibly deposit at high rates in Ar–O2 mixtures, the Y target voltage was used to indirectly feedback-control the O2 partial pressure. Deposition rates as high as ∼70% of the pure metal rates were achieved, typically 3.5 μm/h. Superlattices with periods ranging from 2.6 to 95 nm were deposited. Y2O3 layer thicknesses were either 75% or 50% of the superlattice period. X-ray diffraction and transmission electron microscopy studies showed well-defined superlattice layers. The ZrO2 layers exhibited the high-temperature cubic-fluorite structure, which was epitaxially stabilized by the cubic Y2O3 layers, for thicknesses ≤7 nm. The equilibrium monoclinic structure was observed for thicker ZrO2 layers. Nanoindentation hardnesses ranged from 11.1 to 14.5 GPa with little dependence on period. The hardness results are discussed in terms of current superlattice hardening theories.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 9 , September 1999 , pp. 3614 - 3622
Copyright
Copyright © Materials Research Society 1999

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