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Characterization of interface states in (Sr, Ca)TiO3−x based ceramics by ICTS analysis

Published online by Cambridge University Press:  31 January 2011

Yoshitaka Nakano
Yoshitaka Nakano
Affiliation:
Department of Materials Science and Engineering, School of Science and Engineering, Waseda University, 4–1, Ohkubo 3-chome, Shinjuku-ku, Tokyo 169, Japan
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Abstract

Isothermal capacitance transient spectroscopy measurements were performed to study the reoxidizing induced change in interface states in (Sr, Ca)TiO3−x based ceramics. A discrete acceptor type trap level was detected with reoxidation below the oxidation temperature of grain surfaces, but two deep levels were detected with reoxidation above this temperature. These ICTS results are in good agreement with the previous report with the DLTS measurements. These interface states are considered to originate from chemisorbed oxygen (O2−, O−) on grain surfaces. The O− and O2− chemisorption levels contribute to the non-ohmic conduction with reoxidizing anneals below and above the oxidation temperature, respectively.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 6 , June 1991 , pp. 1346 - 1349
Copyright
Copyright © Materials Research Society 1991

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