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Characterization of hydrofluoric acid treated Y–Ba–Cu–O oxides

Published online by Cambridge University Press:  31 January 2011

Q. X. Jia  and
W. A. Anderson
Q. X. Jia
Affiliation:
Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, New York 14260
W. A. Anderson
Affiliation:
Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, New York 14260
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Abstract

Effects of hydrofluoric acid (HF) treatment on the properties of Y–Ba–Cu–O oxides were investigated. No obvious etching of bulk Y–Ba–Cu–O and no degradation of zero resistance temperature were observed even though the oxides were placed into 49% HF solution for up to 20 h. Surface passivation of Y–Ba–Cu–O due to HF immersion was verified by subsequent immersion of Y–Ba–Cu–O in water. A thin layer of amorphous fluoride formed on the surface of the Y–Ba–Cu–O during HF treatment, which limited further reaction between Y–Ba–Cu–O and HF, and later reaction with water. Thin film Y–Ba–Cu–O was passivated by HF vapors and showed no degradation in Tc-zero after 30 min immersion in water. The properties of the surface layer of Y–Ba–Cu–O oxide after HF treatment are reported from Auger electron spectroscopy, x-ray diffraction, and scanning electron microscopy studies.

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 6 , December 1989 , pp. 1320 - 1325
Copyright
Copyright © Materials Research Society 1989

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