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X-Ray Diffraction Analysis of Thin Clay Films From Dilute Suspensions Using Glancing Incidence Diffraction

Published online by Cambridge University Press:  28 February 2024

Katherine Ozalas  and
Benjamin F. Hajek
Katherine Ozalas
Affiliation:
Eagan McAllister Associates, 2050 Mabelline Rd. Suite J, North Charleston, South Carolina 29406
Benjamin F. Hajek
Affiliation:
Department of Agronomy and Soils, Auburn University, Auburn, Alabama 36849
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Abstract

X-ray diffraction (XRD) analysis of small quantities of clay mounted on glass slides using conventional Bragg-Brentano geometry generally produces unsatisfactory low-intensity reflections masked by amorphous substrate scatter. Glancing-incidence asymmetric Bragg diffraction, an alternative uncoupled geometry, uses a fixed low-incidence angle and parallel-beam optics to increase path length through the sample and decrease X-ray penetration into the substrate. To evaluate this technique on thin soil clay films, results from conventional Bragg-Brentano and glancing-incidence diffraction (GID) were compared for progressively diluted clay suspensions separated from 2 southeastern soils with typical mineral assemblages. Patterns produced by GID showed overall higher reflection intensities and reduced substrate scatter, especially at higher 2θ angles within the amorphous glass region. Using GID, positive identification of clay minerals was obtained from sample quantities as small as 0.005 mg cm−2 and suspensions as dilute as 29 mg L−1.

Keywords

GIDThin FilmsXRD
Type
Research Article
Information
Clays and Clay Minerals , Volume 44 , Issue 6 , December 1996 , pp. 811 - 817
Copyright
Copyright © 1996, The Clay Minerals Society

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