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Quantification Curves for the X-Ray Powder Diffraction Analysis of Mixed-Layer Kaolinite/Smectite

Published online by Cambridge University Press:  02 April 2024

Katsutoshi Tomita  and
Hidewo Takahashi
Katsutoshi Tomita
Affiliation:
Institute of Earth Sciences, Faculty of Science, Kagoshima University, Kagoshima, 890, Japan
Hidewo Takahashi
Affiliation:
Department of Geology, Faculty of Education, Kagoshima University, Kagoshima, 890, Japan
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Abstract

X-ray powder diffraction patterns for many interstratified kaolinite/glycolated smectites were calculated by changing combinations of probabilities and transition probabilities of two component layers. Reichweite = 0 and Reichweite = 1 structures were investigated. The calculated d-values were plotted, with PKS (the probability that a smectite layer succeeds a kaolin layer given that the first layer is a kaolinite layer) and PSK as the axes of coordinates. These d-values were then linked into equal d-value curves on a graph. Four equal d-value diagrams for mixed reflections ranging from 34.0 to 17.1 Å, from 8.5 to 7.2 Å, from 6.13 to 5.68 Å, and from 3.540 to 3.401 Å were constructed. Two examples of identifying natural kaolinite/smectite minerals using these diagrams are presented.

Keywords

Ethylene glycolInterstratificationKaolinite/smectiteMixed-layer quantificationX-ray powder diffraction
Type
Research Article
Information
Clays and Clay Minerals , Volume 34 , Issue 3 , June 1986 , pp. 323 - 329
Copyright
Copyright © 1986, The Clay Minerals Society

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