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X-Ray Fluorescence Spectrometry With Gas Proportional Scintillation Counters

Published online by Cambridge University Press:  06 March 2019

C.A.N. Conde ,
J.M.F. dos Santos ,
Teresa H.V.T. Dias ,
A.J.A. de Campos  and
Benilde F.O. Costa
C.A.N. Conde
Affiliation:
Physics Department University of Coimbra P-3000 Coimbra Portugal
J.M.F. dos Santos
Affiliation:
Physics Department University of Coimbra P-3000 Coimbra Portugal
Teresa H.V.T. Dias
Affiliation:
Physics Department University of Coimbra P-3000 Coimbra Portugal
A.J.A. de Campos
Affiliation:
Physics Department University of Coimbra P-3000 Coimbra Portugal
Benilde F.O. Costa
Affiliation:
Physics Department University of Coimbra P-3000 Coimbra Portugal
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Abstract

An uniform field gas proportional scintillation counter is described for X-ray fluorescence analysis applications requiring large window areas and good energy resolution at rcom temperature. This counter uses continuously purified xenon as the filling gas and a 1 inch diameter window. A quartz window Hamamatsu R562 photomultiplier is used with its window in direct contact with the gas. Measured energy resolutions were in the 12 to 13% range for the 5.9keV X–ray line. X–ray fluorescence spectra for a few samples are presented with excitation by ImC 55Fe and 244cm sources. Measured physical excitation-detection efficiencies are compared with calculated values.

Type
VII. XRF Techniques, Instrumentation and Mathematical Models
Information
Advances in X-Ray Analysis , Volume 31: Thirty-sixth Annual Conference on Applications of X-ray Analysis , 1987 , pp. 445 - 448
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

1. Conde, C.A.N. and F, J.M.. dos Santos, The recessed source geometry for source excited X-ray fluorescence analysis, Adv. in X-ray Anal. 29: 545 (1986),Google Scholar
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