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X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer1.

Published online by Cambridge University Press:  06 March 2019

M. Singh ,
A.J. Dabrowski ,
G.C. Huth ,
J.S. Iwanczyk ,
B.C. Clark  and
A.K. Baird
M. Singh
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
A.J. Dabrowski
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
G.C. Huth
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
J.S. Iwanczyk
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
B.C. Clark
Affiliation:
Martin-Marietta Corporation, Denver, Colorado 80201
A.K. Baird
Affiliation:
Department of Geology, Pomona College, Claremont, California 91711
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Extract

We have previously reported on the uniqueness and potential of room-temperature spectrometry of low-energy x-rays with a mercuric iodide (HgI2) detector (1,2,3). In this paper we emphasize the use of HgI2 detectors for x-ray fluorescence (XRF) analysis.

Because no vacuum plumbing or cryogenic cooling is required, the design of a mercuric iodide room-temperature x-ray spectrometer is extremely simple. Our present design consists of coupling a detector directly to the first-stage FET in a modified Tennelec 161 D preamplifier and making the configuration “light-tight”. Aside from providing a suitable entrance window, there are no other requirements for routine spectroscopy.

Type
XRF: Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 249 - 256
Copyright
Copyright © International Centre for Diffraction Data 1979

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Footnotes

2.

On leave from Institute of Nuclear Research, Swierk, Poland.

1.

Research supported by Department of Energy funding under Contract DE-AS03-76-SF00113.

References

1. Dabrowski, A.J., Huth, G.C., Singh, M. et al: Appl. Phys. Lett. 33 (2), 211–213 (1978)Google Scholar
2. Huth, G.C., Dabrowski, A.J., Singh, M. et al: Adv. in X-ray Analysis, 22, 461–472 (1978)Google Scholar
3. Dabrowski, A.J., Singh, M., Huth, G.C., Iwanczyk, J.S.: Invited Paper, NBS Workshop on Energy Dispersive X-ray Spectrometry, Gaithersburg, Maryland, Aug, 23-25, 1979(In Press)Google Scholar
4. Dabrowski, A.J., Huth, G.C.: IEEE Trans. Nucl. Sci. NS-25 (1), 205211 (1978)Google Scholar
5. Goulding, F.S., Jaklevic, J.M.: LBL-5367 (1976)Google Scholar
6. Goulding, F.S., Jaklevic, J.M.: UCRL-20625 (1971)Google Scholar