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X-Ray Diffractometry of Polymers by a Transmission Method

Published online by Cambridge University Press:  06 March 2019

Zigmond W. Wilchinsky
Zigmond W. Wilchinsky*
Affiliation:
Esso Research and Engineering Company Linden, New Jersey
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Abstract

The practicability of using a symmetrical transmission method for accurate measurement of line positions and intensities for polymer samples was investigated. In comparison with the conventional symmetrical reflection method, the transmission method has some inherent advantages in the measurement of line positions. Very little extraneous line asymmetry is introduced by transmission, and errors due to sample misalignment can usually be corrected empirically. On the other hand, the reflection method introduces noticeable line asymmetry and a shift of the center of intensity toward smaller 2θ. Also, errors due to sample misalignment may be difficult to correct. Intensity measurements can usually be made with about the same accuracy by either method. However, the transmission method is less sensitive to misalignment errors, especially at the lower diffraction angles.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 151 - 161
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

1. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, John Wiley & Sons, Inc., New York, 1954, Chapter 5.Google Scholar
2. Keating, D. T. and Warren, B. E., “The Effect of a Low-Absorption Coefficient in X-Ray Spectrometer Measurements,” Rev. Sci. Inst. 23:519–522, 1952.Google Scholar
3. Brindley, G. W., in: X-Ray Diffraction by Polycrystalline Materials, H. S. Peiser, H. P. Rooksby, and A. J. C. Wilson (eds.), John Wright and Sons, Bristol, England, 1955, Chapter 5.Google Scholar