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What Can Data Analysis Do for X-Ray Microfluorescence Analysis?

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt
John D. Zahrt*
Affiliation:
Applied Theoretical Physics Division, Los Alamos National Laboratory
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Extract

In 1985 Nichols and Ryon [1] first demonstrated their x-ray microfluorescence analysis (XRMF) system. By 1986 Nichols et al. [2] Boehme [3] and Gurker [4] provided us with spectacular photographs of x-ray images of geological materials, wire grids, and semiconductor chip carriers. During the delivery of the paper by Nichols et al. [2] the present author realized that a higher degree of spatial resolution could be accomplished by analysis of the raw data.

Type
III. XRF Mathematical Models and Quantitation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 89 - 95
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

[1] Nichols, M. C. , and Ryon, R. W. , “An X-Ray Micro-Fluorescence Analysis System With Diffraction Capabilities,’ Adv. in X-Ray Anal. 29. 423–426 (1986).Google Scholar
[2] Nichols, Monte C. , et al. , “Parameters Affecting X-Ray Micro fluorescence Analysis,” Adv. in X-Ray Anal. 30, 45–51 (1987).Google Scholar
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[5] Zahrt, John D. , “High Spatial Resolution in X-Ray Fluorescence,” Adv. in X-Ray Anal. 30, 77–83 (1987).Google Scholar
[6] Zahrt, John D. and Carter, Natalie. “The Weierstrass Transform in X-Ray Analysis,” Accepted for publication in Lecture Notes in Pure and Applied Mathematics. Google Scholar
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