Hostname: page-component-84b7d79bbc-l82ql Total loading time: 0 Render date: 2024-07-25T14:05:05.474Z Has data issue: false hasContentIssue false
  • English
  • Français

A Vertically Rotating Double-Crystal X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

M. C. Wittels ,
F. A. Sherrill  and
A. C. Kimbrough
M. C. Wittels
Affiliation:
Oak Ridge National Laboratory, *Oak Ridge, Tennessee
F. A. Sherrill
Affiliation:
Oak Ridge National Laboratory, *Oak Ridge, Tennessee
A. C. Kimbrough
Affiliation:
Oak Ridge National Laboratory, *Oak Ridge, Tennessee
Get access

Abstract

A versatile double-crystal X-ray spectrometer has been developed for the precise measurement of X-ray diffraction line widths to tenths of seconds. The device can be employed in either the parallel or antiparallel arrangement for rocking curve studies and can also be used in anomalous X-ray transmission experiments with nearly perfect crystals.

A detailed description of the instrument is given as well as some results concerning the Darwin theory of X-ray diffraction line widths and Borrmann effects.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 7: Twelfth Annual Conference on Applications of X-ray Analysis, August 7-9, 1963 , 1963 , pp. 265 - 280
Copyright
Copyright © International Centre for Diffraction Data 1963

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Compton, A. H., “The Reflection Coefficient of Monochromatic X-Rays from Rock Salt and Calcite,” Phys, Rev. 10: 95, 1917.Google Scholar
2. Schwarzschild, M., “Theory of the Double X-Ray Spectrometer,” Phys. Rev. 32: 162, 1928.Google Scholar
3. Spencer, R. C., “Additional Theory of the Double X-Ray Spectrometer,” Phys. Rev. 38: 618, 1931.Google Scholar
4. Laue, M. v., Z. Physik 72: 472, 1931.Google Scholar
5. Smith, L. P., “The Determination of X-Ray Line Shapes by a Double-Crystal Spectrometer,” Phys. Rev. 46: 343, 1934.Google Scholar
6. Compton, A. H. and Allison, S. K., X-Rays in Theory and Experiment, D. Van Nostrand Company, Inc., New York, 1946.Google Scholar
7. Wittels, M. C., Sherrill, F. A., and Young, F. W. Jr., Phys. Letters 5: 183, 1963.Google Scholar
8. Darwin, C. G., “The Theory of X-Ray Reflection. Parts I and II,” Phil. Mag. 27: 325 and 675, 1914.Google Scholar
9. International Tables for X-Ray Crystallography, Vol. III. Google Scholar
10. Patel, J. R., Wagner, R. S., and S. Moss, “X-Ray Investigation of the Perfection of Silicon,” Acta Met. 10: 759, 1962.Google Scholar
11. James, R. W., The Optical Principles of the Diffraction of X-Rays, Bell and Sons, London, 1950, p. 318.Google Scholar
12. Kurtz, A. D., Kulin, S. A., and Averbach, B. L., “Effect of Dislocations on the Minority Carrier Lifetime in Semiconductors,” Phys. Rev. 101: 1285, 1956.Google Scholar
13. Borrmann, G., “The Extinction Diagram of Quartz,” Physik Z. 42: 157, 1941.Google Scholar
14. Campbell, H. N., “X-Ray Absorption in a Crystal Set at the Bragg Angle,” J. Appl Phys. 22: 1139, 1951.Google Scholar
15. Rogosa, G. L. and Schwartz, G., “Transmission of X-Rays Through Calcite Near the Bragg Angle,” Phys. Rev. 87: 995, 1952.Google Scholar
16. Brogren, G. and Adell, O., Arkiv Fysik 8: 97, 1945.Google Scholar
17. Hunter, L. P., “Anomalous Transmission of X-Rays by Single Crystal Germanium,” Proc. Koninkl. Ned. Akad. Wetenschap. B61: 214, 1958.Google Scholar
18. Okkerse, B., Philips Research Laboratory, Eindhoven, private communication, 1961.Google Scholar
19. Wittels, M. C., Sherrill, F. A., and Young, F. W. Jr., Appl Phys. Letters 2: 127, 1963.Google Scholar
20. Wittels, M. C., Sherrill, F. A., and Young, F. W. Jr., Appl. Phys. Letters 1: 22, 1962.Google Scholar
21. Lang, A. R., “A Method for the Examination of Crystal Sections Using Penetrating Characteristic X-Radiation,” Acta Met. 5: 358, 1957.Google Scholar