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Using DEC Operating System for X-Ray Diffraction and X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

B. E. Artz
Affiliation:
Ford Motor Company, Engineering and Research Staff Dearborn, Michigan 48121
E. C. Kao
Affiliation:
Ford Motor Company, Engineering and Research Staff Dearborn, Michigan 48121
M. A. Short
Affiliation:
Ford Motor Company, Engineering and Research Staff Dearborn, Michigan 48121
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Abstract

The Digital Equipment Corporation (DEC) operating system RSX-11M has recently been installed on a DEC PDP 11/34 computer which is used for the control of, and to acquire and process data from, three X-ray diffractometers, one X-ray fluorescence analysis unit and an electron microprobe. The RSX-11M system replaced the modified DEC 1 - 8 User BASIC previously employed, thus replacing an operating system which was known in detail only to its writer by a system which is supported by the computer manufacturer. There are three major advantages in the use of RSX-11M over 1 - 8 User BASIC: an improved handling of program scheduling, the integration of the software driver for the computer - X-ray electronics interface into the operating system without a major modification of the latter, and the ability of RSX-11M to undertake concurrent execution of instrument control, data acquisition, and data reduction. The 11/34 - RSX-11M system has been implemented to use FORTRAN; a BASIC interpreter has, however, been added which allows users to interact on-line with the computer. A command interpreter which can accept a command line from a terminal has been included.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1978

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References

1. Cole, H., Okaya, Y., and Chambers, F. W., “Computer Controlled Diffractometer”, Rev. Sci. Inst., 34, 872876 (1963).Google Scholar
2. Artz, B. E., Kelly, Carol J., and Short, M. A., “A Computer Control for an X-Ray Fluorescence Analysis Unit”, in Pickles, W. L. et al., Editors, Advances in X-Ray Analysis, Vol. 18, pp. 309316, Plenum Press (1975).Google Scholar
3. Kelly, Carol J. and Gagliardi, Carl A., “Interactive X-Ray Laboratory Automation Utilizing Multiuser Basic”, Proc. IEEE, 63, 1426-1431 (1975).Google Scholar
4. Kelly, Carol J. and Eichen, E., “Computer Controlled X-Ray Diffraction Measurement of Residual Stress”, in Birks, L. S. et al., Editors, Advances in X-Ray Analysis, Vol. 16, pp. 344353, Plenum Press (1973).Google Scholar