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Some Observations on X-Ray Emission as a Function of Accelerating Voltage in the Microprobe

Published online by Cambridge University Press:  06 March 2019

D. L. Burk
D. L. Burk*
Affiliation:
Allegheny Ludlum Steel Corporation Brackenridge, Pennsylvania
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Abstract

Data are presented from several systems for which the emitted X-ray intensity goes through a maximum as accelerating voltage is increased. An attempt is made to systematize the data in terms of absorption, wavelength, and atomic number. A very simple model, analyzed graphically, is capable of displaying many of the features of the experimental data.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 384 - 399
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

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3. Lane, R. D. and Zaffarano, D. J., “Transmission of 0-40 keV Electrons by'Thin Films with Application to Beta-Ray Spectroscopy,” Phys. Rev. 94:960–964, 1954.Google Scholar