Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-20T18:52:40.334Z Has data issue: false hasContentIssue false

Soft X-Ray Vacuum Ultraviolet Diagnostics of High Density, High Temperature Plasmas at the Air Force Weapons Laboratory

Published online by Cambridge University Press:  06 March 2019

Erskine J. T. Burns*
Affiliation:
Air Force Weapons Laboratory, Kirtland AFB, New Mexico 87117
Get access

Abstract

Soft X-ray, vacuum ultraviolet diagnostics of high temperature, high density plasmas are used to determine the temporal, spatial, spectral and total fluence of radiation emitted from plasmas. Some of the radiation diagnostics used to characterize these plasmas are: metallic photocathodes with thin anodes; Ross filter - PIN detector combination; time-resolved pinhole cameras; metallic calorimeter; bent crystal and grazing incidence spectrographs; and differentially pumped, windowless, Samson-type ionization chambers.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1974

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Henke, B. L., “An Introduction to Low Energy X-ray and Electron Analysis,” in B.L. Henke, J.B. Newkirk and G. E. Mallett, Editors, Advances in X-ray Analysis, Vol. 13, p. 125, Plenum Press (1970).Google Scholar
2. Kerns, J. R. and Johnson, D. J., “A Study of an Electron Beam Discharge into a Vacuum Diode with Polyethylene Anode”, J. Appl. Phys., to be published.Google Scholar
3. Cairns, R. B. and Samson, J. A. R., “Metal Photocathodes as Secondary Standards for Absolute Intensity Measurements in the Vacuum Ultraviolet”, J. Opt. Soc. Am. 56, 15681573 (1966).Google Scholar
4. Lyons, P. B., private communications.Google Scholar
5. McKee, L. L., Burns, E. J. T., Lindstrand, R. A. and Economou, N. P., to be published.Google Scholar
6. Burns, E. J. T., “A Grazing Incidence Spectrograph as Applied to Vacuum Ultraviolet, Soft X-ray, Pulsed Plasma Sources”, AFWLTR- 74-121 (1974).Google Scholar
7. Hobby, M. G. and Peacock, N. J., “Spectrograph Calibration I: from Grating Diffraction Efficiency and Plate Response Factors”, J. Phys. E: Sci. Instrum. 6, 854856 (1973).Google Scholar
8. Johnson, D. J., “Two Systems for Measurement of High-Intensity Vacuum Ultraviolet Plasma Radiation”, AEWL-TR-74-43 (1974).Google Scholar
9. Birks, L. S., “Convex Curved Crystal X-ray Spectrograph”, Rev. Sci. Instrum. 41, 11291132 (1970).Google Scholar
10. Hobby, M. G. and Peacock, N. J., “Line Profile Analysis and the Feasibility of Using Channel Multiplier Plates with the deBroglie Spectrometer”, to be published.Google Scholar
11. Brown, D. B. and Fatemi, M., “X-ray Diffraction in Crystals of Intermediate Perfection. I. Calculation of the Integral Diffracted Power for Flat and Curved Crystals in Symmetrical Bragg Geometry”, J. Appl. Phys. 45, 15441554 (1974).Google Scholar
12. Dozier, C. M., Gilfrich, J. V., and Birks, L. S., “Quantitative Calibration of X-ray Film Response in the 5-keV to 1.3 MeV Region”, Appl. Optics 6, 21362139 (1967).Google Scholar
13. Johnson, D. J., “An X-ray Spectral Measurement System for Nanosecond Plasmas”, Rev. Sci. Instrum. 45, 191194 (1974).Google Scholar
14. Burns, E. J. T., “Calorimeter for Soft X-ray Plasma Sources”, AFWL-TR-73-192 (1973).Google Scholar
15. Bettinali, L., Pecorella, F. and Roger, J. P., “Soft X-ray Image Intensifiers with High Time and Space Resolution”, Rev. Sci. Instrum. 42, 18341836 (1971).Google Scholar