Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-07-01T04:00:56.725Z Has data issue: false hasContentIssue false

A Soft X-ray Experimental Facility

Published online by Cambridge University Press:  06 March 2019

John V. Gilfrich
Affiliation:
Naval Research Laboratory Washington, D.C. 20375-5000
David J. Nagel
Affiliation:
Naval Research Laboratory Washington, D.C. 20375-5000
Mohammad Fatemi
Affiliation:
Naval Research Laboratory Washington, D.C. 20375-5000
Richard D. Bleach
Affiliation:
Naval Research Laboratory Washington, D.C. 20375-5000
Karrol R. Hudson
Affiliation:
Naval Research Laboratory Washington, D.C. 20375-5000
Get access

Abstract

A high vacuum soft x-ray source has been coupled to a large volume experimental chamber to provide a versatile facility for x-ray investigations in the energy range of 0.1 to 10 kev. The source chamber presently contains a modified Herike tube, but can employ any of a variety of source designs. The large experimental chamber is equipped with a kinematic mount to position a number of x-ray optical instruments. The source and experimental chambers are connected through a high vacuum valve/shutter, and are pumped separately with provision for a thin window to isolate one from the other, single and double crystal spectrometers have been used in the experimental chamber. A variable chord diffractometer/reflectometer using double crystal monnotiromatization has been designed, in addition, the facility has been used to expose photoresists in x-ray lithography tests.

Type
IV. Recent Developments in Long-Wavelength Spectroscopy
Copyright
Copyright © International Centre for Diffraction Data 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Henke, B. L., An introduction to low energy x-ray and electron analysis, Advances in X-Ray Analysis, Vol. 13, Plenum Press, New York, 1970, p. 5.Google Scholar
2. Henke, B. L. and Tester, M.A., Techniques of low energy x-ray spectroscopy (0.1 to 2 keV region), Advances in X-Ray Analysis, Vol. 18, Plenum Press, New York, 1975, p. 74.Google Scholar
3. Vanhatalo, J., Kaihola, L. and Suoninen, E., Gas tube as radiation source for soft x-ray spectrometer, J. Phys. E: Sci. instrum. 9:1156 (1976).Google Scholar
4. Sato, K., Tanaka, I. and Otsuki, T., X-ray fluorescence analysis in the X-ray region of 0 .4 to 7 nm; Application to determination of fluorine in slags, X-Ray Spectrom. 8:68 (1979).Google Scholar
5. Witmer, A. W. van Meijl, and E. W. J. M., The application of long wavelength radiation in X-ray analysis, Spectrochim. Acta 34B:415 (1979).Google Scholar
6. Aschenbach, B., Brauninger, H., Stephan, K. H. and Trumper, J., x-ray test facilities at Max - Planck - Instut Garching, SPIE 184:234 (1979).Google Scholar
7. Stephan, K. H., Predehl, P., Aschenbach, B., Brauninger, H. and Ondrusch, A., Soft X-ray sources for the Max-Planck-Instut. (MPI) long beam (130m) test facility, SPIE 316:203 (1981).Google Scholar
8. Heroux, L., Absolute photon counting in the ultraviolet, in “Spectrometrie Techniques II,” Vanasse, G. A., ed ., Academic Press, New York (1981).Google Scholar
9.J. E. Manson Company, post office Box 1288, Concord, ma 01742.Google Scholar
10. Liefeld, R. J., Hew Mexico State University, Las Cruces, NM, private communication.Google Scholar
11. Findley, D. S., Bowyer, S., Paresce, F. and Malina, R.F., Continuous discharge Penning source with emission lines between 50A and 300A, Applied Optics 18:649 (1979).Google Scholar
12. Ma, I., Electronics Technology Division, NRL, private communication.Google Scholar
13. Dozier, C. M. and Brown, D.B., Effect of Photon Energy on the Response of MOS Devices, IEEE Trans, on Nucl. Sci. NS-28:4137 (1981).Google Scholar
14. Dozier, C. M., Brown, D. B., Birks, L. S., Lyons, P. B. and Benjamin, R.F., Sensitivity of X-Ray Films. II. Kodak No-Screen in the 1-100 keV Region, Journ. Appl. Phys. 47:3732 (1976).Google Scholar