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Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite

Published online by Cambridge University Press:  06 March 2019

X. Zhu ,
P. Predecki ,
M. Eatough  and
R. Goebner
X. Zhu*
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
P. Predecki
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
M. Eatough
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
R. Goebner
Affiliation:
Dept. of Engineering, University of Denver, CO 80208, USA
*
†Current address: Oak Ridge National Laboratory, P.O. Box 2008, MS 6064, Oak Ridge, TN 37831.
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Abstract

This study uses the asymmetric grazing incidence x-ray diffraction (GIXD) method and related z-profile retrieval techniques to study the near surface residual stress depth proflles on ground and on polished surfaces of hot-pressed Al2O2SiC(w) composite specimen. The z-profiles of stress components σ11, σ22 and σ33 of the Al2O3 matrix were obtained by using the numerical inversion method as well as the inverse Laplace method. Both τ- and z-profiles of residual stresses are presented.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 371 - 380
Copyright
Copyright © International Centre for Diffraction Data 1995

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References

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