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Quantitative Determimatioh of Sulfur, Chlorine, Potassium, Calcium, Scandium and Titanium in Aqueous Solutions by Radioisotopic Excited Fluorescent Spectrometer and by Conventional X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

Frank L. Chan  and
W. Barclay Jones
Frank L. Chan
Affiliation:
Aerospace Research Laboratories, Wright-Patterson Air Force Base, Ohio 45433
W. Barclay Jones
Affiliation:
Yale University, New Haven, Connecticut 06511
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Abstract

An x-ray spectrometer with experimental results is herewith described using a radiosotope source Fe55 having a halflife of 2.6 years. As a result of the disintegration, the managanese x-rays are capable of exciting fluorescent x-rays of such elements as sulfur, chlorine, potassium, calcium, scandium and titanium in aqueous solutions. These elements with the Ka wavelengths ranging from 5.3729 Å to 2.7496 Å may be designated as between the very soft x-rays on the one hand and the hard x-rays on the other. The x-ray spectrometer presently described has achieved a resolution of 136 ev, FWHM.

Simultaneously, these elements have also been quantitatively determined by conventional x-ray fluorescent spectrometers. Since one of the spectrometers is designed to operate in vacuum as well as in helium or air, determination of sulfur, potassium and calcium were carried out in vacuum. Determination of chlorine was carried out in a helium atmosphere, Calcium, scandium and titanium were determined in air with an air-path spectrometer.

In the present study aqueous solutions containing these elements were used. The use of aqueous solutions has the inherent advantages of being homogeneous and free from effect of particle size.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 14: Nineteenth Annual Conference on Applications of X-ray Analysis, August 5-7, 1970 , 1970 , pp. 102 - 126
Copyright
Copyright © International Centre for Diffraction Data 1970

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References

Jones, W. Barclay and Carpenter, Robert A., “Sensitivity of a Nondispersive X- ray Fluorescent Spectrometer for Multielement Trace Analysis.” Paper presented at the Second International Symposium on Nucleonics in Aerospace held in Columbus, Ohio, 12–14 July 1967.Google Scholar
Birks, L. S., “X- ray Spectrochemical Analysis,” Interscience Publishers, Inc., New York, 1959, p. 37.Google Scholar
Zulliger, H. R. and Aitken, D. W., IEEE Trans. Nuclear Science, NS-14, 1967, p. 563.Google Scholar
Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H. and Zemany, P. D., “X- ray Absorption and Emission in Analytical Chemistry,” John Wiley and Sons, New York (1960), p. 328.Google Scholar
Chan, Frank L., “A Study of Silicon Determination in Organo-Silicon Compounds by X- ray Fluorescence with Vacuum Spectrograph,” Analytical Chemistry, Society of Analytical Chemistry of Great Britain (1965), pp. 89–101.Google Scholar
Chan, Frank L. and Brooks, Donald A., “A Study of Homogenity of Solid Solutions of Cadmium Sulfide and Cadmium Selenide by X- ray Fluorescence,” in Mueller, W. M., Mallett, G. R., and Fay, M. J., Editors, Advances in X- ray Analysis, Vol. 8, Plenum Press, New York (1965), pp. 420–430.Google Scholar
Jones, W. Barclay and Carpenter, Robert A., “Nondispersive X- ray Fluorescent Spectrometer,” in Newkirk, John B., Mallett, Gavin R. and Pfeiffer, Heinz G., Editors, Advances in X- ray Analysis, Vol. 11, Plenum Press, New York (1968), pp. 214–229.Google Scholar
Chan, Frank L. and Carpenter, James T., “Solid Solutions of Cadmium Sulfide - Cadmium Selenide Films,” in Barrett, C. S., Newkirk, J. B., and Mallett, G. R., Editors, Advances in X- ray Analysis, Vol. 12, Plenum Press, New York (1969), pp. 581–600.Google Scholar
Chan, Frank L., “Dispersive and Nondispersive X- ray Fluorescence Methods for the Measurement of the Thickness of Films of Cadmium Sulfide and Other II-V1 Compounds,” in Grove, E. L. and Perkins, Alfred J., Editors, Developments in Applied Spectroscopy, Vol. 7A, Plenum Press, New York (1969), pp. 3–30.Google Scholar
Chan, Frank L., “On-stream Analysis of Liquid Samples Containing Elements of High and Low Atomic Number by X- ray Fluorescence with Air and Vacuum Spectrograph,” in Henke, Burton L., Newkirk, John B. and Mallett, Gavin R., Editors, Advances in X- ray Analysis, Vol. 13, Plenum Press, New York (1970), pp. 105–124.Google Scholar