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Preparation of Electron Probe Microanalyzer Standards using a Rapid Quench Method

Published online by Cambridge University Press:  06 March 2019

J. I. Goldstein ,
F. J. Majeske  and
H. Yakowitz
J. I. Goldstein
Affiliation:
Goddard Space Flight Center National Aeronautics and Space Administration Greenbelt, Maryland
F. J. Majeske
Affiliation:
Melpar, Inc. Goddard Space Flight Center National Aeronautics and Space Administration Greenbelt, Maryland
H. Yakowitz
Affiliation:
National Bureau of Standards Washington, D.C.
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Abstract

Standards for microprobe analysis can be made to serve two purposes: (a) proposed correction models can be tested with them, and (b) analysis can be performed more accurately in the system which includes the standard. Few microprobe standards presently are available because they must be homogeneous on the micron scale and their composition must be known accurately. A modified Duwez splat cooling method is described which enables the investigator to prepare suitable standards in most cases. The apparatus which is relatively simple and inexpensive is described in detail. The systems Au-Si and Al-Mg were chosen as test cases. Suitable standards were prepared at different concentrations in each system. The analytical results for all compositions in Al-Mg are presented and discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 431 - 446
Copyright
Copyright © International Centre for Diffraction Data 1966

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References

1. Castaing, R., “Application of Electron Probes to Local Chemical and Crystallographic, Analysis,” Thesis, University of Paris, 1951.Google Scholar
2. Birks, L. S., Gilfrich, J. V., and Yakowitz, H., “Report of the Washington Electron Probe Users Group,” ASTM Spec. Tech. Publ, in press.Google Scholar
3. Yakowitz, H., “Evaluation of Specimen Preparation and the Use of Standards in Electron Probe Microanalysis,” ASTM Spec. Tech. Publ., in press.Google Scholar
4. Yakowitz, H., Vieth, D. L., Henirich, K. F. J., and Michaelis, R. E., “Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel,” Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1966, p. 289.Google Scholar
5. Goldstein, J. I., Hanneman, R, E., and Ogilvie, R. E., “Diffusion in the Fe—Ni System at 1 Atmosphere and 40k Bar Pressure,” Trans. AIME 233: 812, 1965.Google Scholar
6. Ziebold, T. O., “Ternary Diffusion in Cu-Ag-Au Alloys,” Ph.D. Thesis (MIT),. 1965.Google Scholar
7. Yakowite, H., Vieth, D. L., and Michaelis, R. E., “Homogeneity Characterization of NBS Spectrometric Standards III: White Cast Iron and Stainless Steel Powder Compact,” MBS Misc. Publ. 260-12, 13 pp., issued September 19, 1966.Google Scholar
8. Duwea, P., Willens, R. H., and Klement, W. Jr., “Continuous Series of Metastable Solid Solutions in Ag-Cu Alloys,” J. Appl Phys. 31: 1136, 1960.Google Scholar
9. Hansen, M., Constitution of Binary Alloys (second éd.), McGraw-Hill Book Co., New York, 1958, p. 105 cf, and p. 232.Google Scholar
10. Klement, W. Jr., “Lattice Parameters of the Metastable Close Packed Structures in Ag-Ge Alloys,” J. Inst. Metals 90: 27, 1961.Google Scholar
11. J., Laberrigue-Frolow and Radvanyi, P., “Le Rendement de Fluoresoence de la Couche K. Mesures Spectre-métriques sur 99 Tc* (6.04 h) et 115, 49 In* (4.5 h),” J. Phys. Radium 17: 944, 43, 1956.Google Scholar
12. Duncumb, P. and Shields, P. K., “Effects of Critical Excitation Potential on the Absorption Correction,” in: The Electron Microprobe, T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry (eds.), John Wiley & Sons; New York, 1966, p. 284.Google Scholar
13. Heinrich, K. F. J., “X-Ray Absorption Uncertainty,” in: The Electron Microprobe, T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry (eds.), John Wiley & Sons, New York, 1966, p. 296.Google Scholar
14. Yakowitz, H. and Heinrich, K. F. J., “Quantitative Electron Probe Microanalysis: Absorption Correction Uncertainty,“ Mikrochim. Acta, in press.Google Scholar
15. Ziebold, T. O. and Ogilvie, R. E., “An Empirical Method for Electron Microanalysis,” Anal. Chem. 36: 322, 1964.Google Scholar