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Peak Broadening in Asymmetric Powder Diffraction

Published online by Cambridge University Press:  06 March 2019

Danut Dragoi
Danut Dragoi*
Affiliation:
University of Denver Department of Engineering Denver, CO 80208
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Abstract

In the case of asymmetric X-Ray powder diffraction, usually used for stress analysis, the peak broadening is a function of the following instrumental parameters: divergence angle of incident and diffracted X-Ray beams (equatorial divergence), divergence angle of Soller slits (axial divergence), tilt angle ψ, and the intrinsic parameters of the sample (Bragg angle, size and mosaicity of the microcrystals, crystallographic imperfections due to atom impurities). This effect of peak broadening is discussed quantitatively, independent of the form of the peak, by using an approximation of a constant distribution of the intensities of diffracted X-Ray beams. The broadening effect due only to the ψ tilt of the sample surface is studied in this work. The results are compared with experimental data obtained on ceramic composite material: α-Al2O3/SiC(whisker).

Type
IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 603 - 607
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1. Cullity, B. D., “Elements of X-Ray Diffraction”, 2-nd edition, Addison-Wesley Publishing Company, Inc., (1978).Google Scholar
2. Thomas, D. J., Acta Cryst. A48, 134–158, (1992).Google Scholar