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Microtomography Detector Design: It's Not Just Resolution

Published online by Cambridge University Press:  06 March 2019

H. W. Deckman ,
K. L. D'Amico ,
J. H. Dunsmuir ,
B. P. Flannery  and
Sol M. Grunert
H. W. Deckman
Affiliation:
Exxon Research and Engineering Company Clinton Township, Route 22 East Annandale, NJ 08801
K. L. D'Amico
Affiliation:
Exxon Research and Engineering Company Clinton Township, Route 22 East Annandale, NJ 08801
J. H. Dunsmuir
Affiliation:
Exxon Research and Engineering Company Clinton Township, Route 22 East Annandale, NJ 08801
B. P. Flannery
Affiliation:
Exxon Research and Engineering Company Clinton Township, Route 22 East Annandale, NJ 08801
Sol M. Grunert
Affiliation:
Exxon Research and Engineering Company Clinton Township, Route 22 East Annandale, NJ 08801
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Extract

The design of an x-ray detector suitable for use in tomography must be optimized for the intended application. Recently, we have developed microtomography applications that require resolution of -1 micron in three spatial dimensions and -1% statistical accuracy in the reconstruction of attenuation coefficients for each cubic micron volume element in a .1 cubic mm specimen. X-ray detector design for these applications must take into account much more than just the demanding micron spatial resolution requirement. The detector must be optimized to take into account the physical properties of the specimen to be measured, the characteristics of the x-ray beam available to probe the specimen, signal to noise ratios needed in the reconstructed image and requirements of the data processing algorithm. In addition, the detector design should be sufficiently flexible to allow significant variation in the kinds of specimens that can be examined.

Type
X. X-Ray Tomography, Imaging, and Topography
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 641 - 650
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1. Flannery, B.P., Three-Dimensional X-Ray Microtomography, Science. 237:1439 (1987).Google Scholar
2. Grodzins, L., Optimum Energies for X-Ray Transmission Tomography of Small Samples - Applications of Synchrotron Radiation to Computerized Tomography, Nucl. Instrum. Methods. 206:541 (1983).Google Scholar
3. Deckman, H.W., Dunsmuir, J.H. and Gruner, S.M., to be published.Google Scholar
4. Gruner, S.M., Milch, J.R. and Reynolds, G.T., Survey of Two Dimensional Electro-optical X-Ray Detectors, Nucl. Instrum, Methods. 195:287 (1982).Google Scholar
5. Deckman, H.W. and Gruner, S.M., Format Alterations in CCD Based Electro-optic X-Ray Detectors, Nucl. Instrum. Methods. 246:527 (1986).Google Scholar
6. Roberge, W.G. and Flannery, B.P., Computed Tomography by Direct Fourier Inversion II, Noise Amplification and Spatial Resolution, to be published.Google Scholar